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Characterization of Atomic Structures

In recent years, it has become clear that any surface or film growth and characterization laboratory must include scanning tunneling and atomic force microscopy. This essential tool can clarify many questions that arise in the development of new materials by giving a direct visualization of the surface structures and atomic positions.
STM and AFM

Our uhv STM / AFM is a Park Scientific Instruments machine shown here with Dr. J. Karunamuni who used it to characterize the oxidation of Fe films on Cu(001).

This instrument also includes LEED for characterizing long-range ordered surface structures. Not shown in this picture is the film deposition side chamber where all films are grown and oxidized.